A picture is worth a thousand words. But sometimes a picture is not enough. When researchers need other tools and techniques to go beyond nanometer scale imaging, these instruments and products for SEM or TEM are the answer. They allow scientists to measure elemental composition or crystallography, probe valence band transitions, count single electrons in EM images or perform in-situ experiments at unprecedented acquisition rates. We list below instrumentation and equipment meant to be added to or work together with an existing electron microscope.
Cameras: CCD and direct detection
Electron Energy-Loss Spectrometers (EELS) and Gatan Image Filters (GIF)
Electron Microscope Analyzers
SEM or FIB miscellaneous accessories
SEM or FIB stages, holders and airlocks
TEM Specimen Holders
Time-of-Flight Secondary Ion Mass Spectrometry
Cathodoluminescence (CL) is the emission of photons of characteristic wavelengths in the visible spectrum which is caused by the interaction of the electron beam with a sample. CL is a powerful structural and compositional analysis technique for materials that can reveal valuable information that cannot be obtained through SE, BSE or EDX. Such information includes zonal composition, lattice structure, superimposed strain or damage to the structure of the material. SEM-based CL imaging achieves much better resolution compared to optical CL microscopes.
NEW Gatan Monarc CL detector dramatically boosts sensitivity and spectral resolution, empowering the most complete CL analysis to date with unique wavelength- and angle-resolved capabilities.
CCD or CMOS based digital cameras to acquire images in Transmission Electron Microscopy. From entry-level devices to the latest in-situ direct detection technology.
Chillers and heat exchangers to cool equipment and keep them at a stable working temperature, to ensure optimal performance and minimize thermal drift.
By measuring the energy lost by the electron beam in its interaction with the sample it is possible to obtain chemical and elemental information with high energy resolution. It is also possible to filter electrons based on their energy loss and thus create an elemental map or improve image quality by removing inelastically scattered electrons.
We offer a unique range of analysis methods for materials characterization on electron microscopes, capable of elemental or crystallographycal analysis.
The beams in a SEM or FIB are capable of producing a variety of signals (SE, BSE, SI, etc.), which can be acquired by special detectors as listed below. We also list other accessories to help SEMs experiments, such as decontaminators, flood guns, and devices not listed in the other categories.
Specialty stages add new functionalities to an existing system, such as the ability to cool or heat the sample, mechanical testing, serial block-face imaging, cryogenic capabilities and more.
We provide software solutions for automation, data handling, analysis, simulation and 3D reconstruction as well as supporting software for special techniques such as correlative microscopy, gun shot residue analysis, lithography, and more.
Scanning Transmission Electron Microscopy is a combination of SEM and TEM in which the beam is raster-scanned over the sample and the transmitted electrons are collected by a detector underneath. It can be used in SEMs or TEMs provided the samples are thin enough. Depending on the collection angle of the transmitted electron, we distinguish between Bright Field (BF), Dark Field (DF) and High Angle Annular Dark Field (HAADF) detectors.
Specialty stages add new functionalities to an existing system, such as the ability to cool or heat the sample, to create gas or liquid in-operando environments, to perform high-tilt tomography, to perform electrical, straining, cathodoluminescence measurements and more.
This laser-based technology enables researchers to see the dynamics of nanomaterials at fast time scales and with high throughput. These products capture images at the ultrafast time scales that are essential to our understanding of many important nanomaterials, including proteins, drug encapsulation nanoparticles, catalyst nanoparticles, thin films, photonic waveguides, optical metamaterials and semiconductor devices. We believe that by illuminating the dynamics of the nanoscale, our products will drive technological and scientific progress across a host of markets and disciplines.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a highly sensitive analytical technique that provides chemical characterization of the surfaces of materials. This is achieved by using a focused ion beam at typical energies of 10-30 keV, which impinges on the surface of the sample and as a result secondary ions (SI) are emitted from the uppermost atomic layers of the specimen. These ions are collected and analyzed by Mass Spectrometry which provides high sensitivity to trace elements, down to parts per million. TESCAN is the only company that offers an integrated system which combines the high-resolution of a FIB-SEM with the high chemical sensitivity of a ToF-SIMS system.